(The) fabrication and characterization of PI-HFET (P-type insulated gate heterostructure FET)PI-HFET(P-type insulated gate heterostructure FET)의 제작과 특성 측정

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For VLSI application, DCFL is needed due to its low power consumption without decreasing the speed. DCFL requires high gate-to-channel barrier height. Existed GaAs MESFET or HFETs whose gate materials are metal or $n^+$-semiconductor have low barrier heights, 0.7-1.2[eV]. On the other hand $p^+$-type. GaAs gate offers a higher barrier height, -1.8 [eV] for channel electrons. But the barrier height for the holes in $p^+$ -type gate is -1.4 [eV]. The fabricated PI-HFETs show 1.2[V] cut-in voltage.
Advisors
Kwon, Young-SeresearcherLee, Kwy-Roresearcher권영세researcher이귀로researcher
Description
한국과학기술원 : 전기 및 전자공학과,
Publisher
한국과학기술원
Issue Date
1990
Identifier
67391/325007 / 000881530
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 전기 및 전자공학과, 1990.2, [ [ii], 48, [1] p. ]

URI
http://hdl.handle.net/10203/39180
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=67391&flag=dissertation
Appears in Collection
EE-Theses_Master(석사논문)
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