(The) fabrication and characterization of PI-HFET (P-type insulated gate heterostructure FET)PI-HFET(P-type insulated gate heterostructure FET)의 제작과 특성 측정

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dc.contributor.advisorKwon, Young-Se-
dc.contributor.advisorLee, Kwy-Ro-
dc.contributor.advisor권영세-
dc.contributor.advisor이귀로-
dc.contributor.authorHan, Jong-Hee-
dc.contributor.author한종희-
dc.date.accessioned2011-12-14T02:14:53Z-
dc.date.available2011-12-14T02:14:53Z-
dc.date.issued1990-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=67391&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/39180-
dc.description학위논문(석사) - 한국과학기술원 : 전기 및 전자공학과, 1990.2, [ [ii], 48, [1] p. ]-
dc.description.abstractFor VLSI application, DCFL is needed due to its low power consumption without decreasing the speed. DCFL requires high gate-to-channel barrier height. Existed GaAs MESFET or HFETs whose gate materials are metal or $n^+$-semiconductor have low barrier heights, 0.7-1.2[eV]. On the other hand $p^+$-type. GaAs gate offers a higher barrier height, -1.8 [eV] for channel electrons. But the barrier height for the holes in $p^+$ -type gate is -1.4 [eV]. The fabricated PI-HFETs show 1.2[V] cut-in voltage.eng
dc.languageeng-
dc.publisher한국과학기술원-
dc.title(The) fabrication and characterization of PI-HFET (P-type insulated gate heterostructure FET)-
dc.title.alternativePI-HFET(P-type insulated gate heterostructure FET)의 제작과 특성 측정-
dc.typeThesis(Master)-
dc.identifier.CNRN67391/325007-
dc.description.department한국과학기술원 : 전기 및 전자공학과, -
dc.identifier.uid000881530-
dc.contributor.localauthorKwon, Young-Se-
dc.contributor.localauthorLee, Kwy-Ro-
dc.contributor.localauthor권영세-
dc.contributor.localauthor이귀로-
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EE-Theses_Master(석사논문)
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