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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Impact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization

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dc.contributor.author장규선ko
dc.contributor.authorKo, Won‐Seokko
dc.contributor.authorSon, Ji‐Heeko
dc.contributor.authorJang, Jeong‐Inko
dc.contributor.authorKim, Bongseoko
dc.contributor.authorVega‐Parades, Miquelko
dc.contributor.authorJang, Hanhwiko
dc.contributor.authorAllahyari Maryamko
dc.contributor.authorKim, Se‐Hoko
dc.contributor.authorRyou, KenHeeko
dc.contributor.author채동현ko
dc.contributor.author박하일ko
dc.contributor.author정연식ko
dc.contributor.authorOh, Min‐Wookko
dc.contributor.authorJung, Chanwonko
dc.contributor.authorScheu, Christinako
dc.contributor.authorChoi, Pyuck-Pako
dc.date.accessioned2024-09-06T10:00:09Z-
dc.date.available2024-09-06T10:00:09Z-
dc.date.created2024-09-06-
dc.date.issued2024-04-
dc.identifier.citationADVANCED FUNCTIONAL MATERIALS-
dc.identifier.issn1616-301X-
dc.identifier.urihttp://hdl.handle.net/10203/322817-
dc.languageEnglish-
dc.publisherJohn Wiley & Sons Ltd.-
dc.titleImpact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization-
dc.typeArticle-
dc.type.rimsART-
dc.citation.publicationnameADVANCED FUNCTIONAL MATERIALS-
dc.contributor.localauthor정연식-
dc.contributor.localauthorChoi, Pyuck-Pa-
dc.contributor.nonIdAuthorKo, Won‐Seok-
dc.contributor.nonIdAuthorSon, Ji‐Hee-
dc.contributor.nonIdAuthorJang, Jeong‐In-
dc.contributor.nonIdAuthorKim, Bongseo-
dc.contributor.nonIdAuthorVega‐Parades, Miquel-
dc.contributor.nonIdAuthorJang, Hanhwi-
dc.contributor.nonIdAuthorAllahyari Maryam-
dc.contributor.nonIdAuthorKim, Se‐Ho-
dc.contributor.nonIdAuthorRyou, KenHee-
dc.contributor.nonIdAuthorOh, Min‐Wook-
dc.contributor.nonIdAuthorJung, Chanwon-
dc.contributor.nonIdAuthorScheu, Christina-
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MS-Journal Papers(저널논문)
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