Contrastive Knowledge Distillation for Anomaly Detection in Multi-Illumination/Focus Display Images

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dc.contributor.authorPark, Hangilko
dc.contributor.authorLee, Jihyunko
dc.contributor.authorSeo, Yongminko
dc.contributor.authorMin, Taewonko
dc.contributor.authorYun, Judongko
dc.contributor.authorKim, Jaehwanko
dc.contributor.authorKim, Tae-Kyunko
dc.date.accessioned2023-11-28T08:04:27Z-
dc.date.available2023-11-28T08:04:27Z-
dc.date.created2023-11-27-
dc.date.issued2023-07-24-
dc.identifier.citation18th International Conference on Machine Vision and Applications, MVA 2023-
dc.identifier.urihttp://hdl.handle.net/10203/315354-
dc.description.abstractIn this paper, we tackle automatic anomaly detection in multi-illumination and multi-focus display images. The minute defects on the display surface are hard to spot out in RGB images and by a model trained with only normal data. To address this, we propose a novel contrastive learning scheme for knowledge distillation-based anomaly detection. In our framework, Multiresolution Knowledge Distillation (MKD) is adopted as a baseline, which operates by measuring feature similarities between the teacher and student networks. Based on MKD, we propose a novel contrastive learning method, namely Multiresolution Contrastive Distillation (MCD), which does not require positive/negative pairs with an anchor but operates by pulling/pushing the distance between the teacher and student features. Furthermore, we propose the blending module that transforms and aggregate multi-channel information to the three-channel input layer of MCD. Our proposed method significantly outperforms competitive state-of-the-art methods in both AUROC and accuracy metrics on the collected Multi-illumination and Multi-focus display image dataset for Anomaly Detection (MMdAD).-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleContrastive Knowledge Distillation for Anomaly Detection in Multi-Illumination/Focus Display Images-
dc.typeConference-
dc.identifier.wosid001057888900029-
dc.identifier.scopusid2-s2.0-85170521491-
dc.type.rimsCONF-
dc.citation.publicationname18th International Conference on Machine Vision and Applications, MVA 2023-
dc.identifier.conferencecountryJA-
dc.identifier.conferencelocationHamamatsu-
dc.identifier.doi10.23919/MVA57639.2023.10215808-
dc.contributor.localauthorKim, Tae-Kyun-
dc.contributor.nonIdAuthorSeo, Yongmin-
dc.contributor.nonIdAuthorMin, Taewon-
dc.contributor.nonIdAuthorYun, Judong-
dc.contributor.nonIdAuthorKim, Jaehwan-
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CS-Conference Papers(학술회의논문)
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