DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Sungho | ko |
dc.contributor.author | Kim, Moon-Seok | ko |
dc.contributor.author | Lee, Yongwoo | ko |
dc.contributor.author | Kim, Hee-Dong | ko |
dc.contributor.author | Choi, Yang-Kyu | ko |
dc.contributor.author | Choi, Sung-Jin | ko |
dc.date.accessioned | 2021-07-07T06:30:13Z | - |
dc.date.available | 2021-07-07T06:30:13Z | - |
dc.date.created | 2021-06-25 | - |
dc.date.created | 2021-06-25 | - |
dc.date.created | 2021-06-25 | - |
dc.date.created | 2021-06-25 | - |
dc.date.created | 2021-06-25 | - |
dc.date.issued | 2021-06 | - |
dc.identifier.citation | IEEE ACCESS, v.9, pp.91341 - 91346 | - |
dc.identifier.issn | 2169-3536 | - |
dc.identifier.uri | http://hdl.handle.net/10203/286478 | - |
dc.description.abstract | Although the intrinsic variability in nanoelectronic devices has been a major obstacle and has prevented mass production, this natural stochasticity can be an asset in hardware security applications. Herein, we demonstrate a true random number generator (TRNG) based on stochastic carrier trapping/detrapping processes in randomly distributed carbon nanotube networks. The bitstreams collected from the TRNG passed all the National Institute of Standards and Technology randomness tests without post-processing. The random bit generated in this study is sufficient for encryption applications, particularly those related to the Internet of Things and edge computing, which require significantly lower power consumption. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Low-Power True Random Number Generator Based on Randomly Distributed Carbon Nanotube Networks | - |
dc.type | Article | - |
dc.identifier.wosid | 000673644200001 | - |
dc.identifier.scopusid | 2-s2.0-85112156312 | - |
dc.type.rims | ART | - |
dc.citation.volume | 9 | - |
dc.citation.beginningpage | 91341 | - |
dc.citation.endingpage | 91346 | - |
dc.citation.publicationname | IEEE ACCESS | - |
dc.identifier.doi | 10.1109/ACCESS.2021.3091491 | - |
dc.contributor.localauthor | Choi, Yang-Kyu | - |
dc.contributor.nonIdAuthor | Kim, Sungho | - |
dc.contributor.nonIdAuthor | Lee, Yongwoo | - |
dc.contributor.nonIdAuthor | Kim, Hee-Dong | - |
dc.contributor.nonIdAuthor | Choi, Sung-Jin | - |
dc.description.isOpenAccess | Y | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Transistors | - |
dc.subject.keywordAuthor | Generators | - |
dc.subject.keywordAuthor | Tunneling | - |
dc.subject.keywordAuthor | Surface treatment | - |
dc.subject.keywordAuthor | Memristors | - |
dc.subject.keywordAuthor | Electron traps | - |
dc.subject.keywordAuthor | Thermal stability | - |
dc.subject.keywordAuthor | Carbon nanotube network | - |
dc.subject.keywordAuthor | random number generator | - |
dc.subject.keywordAuthor | stochastic carrier trapping | - |
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