A PVT-Robust and Low-Jitter Ring-VCO-Based Injection-Locked Clock Multiplier With a Continuous Frequency-Tracking Loop Using a Replica-Delay Cell and a Dual-Edge Phase Detector

Cited 60 time in webofscience Cited 56 time in scopus
  • Hit : 254
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorChoi, Seojinko
dc.contributor.authorYoo, Seyeonko
dc.contributor.authorLim, Younghyunko
dc.contributor.authorChoi, Jaehyoukko
dc.date.accessioned2019-08-08T00:20:14Z-
dc.date.available2019-08-08T00:20:14Z-
dc.date.created2019-08-07-
dc.date.created2019-08-07-
dc.date.created2019-08-07-
dc.date.issued2016-08-
dc.identifier.citationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.51, no.8, pp.1878 - 1889-
dc.identifier.issn0018-9200-
dc.identifier.urihttp://hdl.handle.net/10203/264101-
dc.description.abstractA low-jitter, ring-type voltage-controlled oscillator (VCO)-based injection-locked clock multiplier (ILCM) with a continuous frequency-tracking loop (FTL) for process-voltage-temperature (PVT)-calibration is presented. Using a single replica-delay cell of the VCO that provides the intrinsic phase information of the free-running VCO, the proposed FTL can continuously track and correct frequency drifts. Therefore, the proposed ILCM can calibrate real-time frequency drifts due to voltage or temperature variations as well as static frequency deviations due to process variations. Since the FTL provided an additional filtering of in-band VCO noise, the ILCM was able to achieve excellent jitter performance over the PVT variations, while it was based on a ring-VCO. The proposed ILCM was fabricated in a 65 nm CMOS process. When injection locked, the RMS-jitter integrated from 10 kHz to 40 MHz of the 1.20 GHz output signal was 185 fs. The proposed PVT-calibrator regulated the degradations of jitter to less than 5% and 7% over temperatures and supply voltages, respectively. The active area was 0.06 mm(2) and total power consumption was 9.5 mW.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleA PVT-Robust and Low-Jitter Ring-VCO-Based Injection-Locked Clock Multiplier With a Continuous Frequency-Tracking Loop Using a Replica-Delay Cell and a Dual-Edge Phase Detector-
dc.typeArticle-
dc.identifier.wosid000382169400013-
dc.identifier.scopusid2-s2.0-84976271612-
dc.type.rimsART-
dc.citation.volume51-
dc.citation.issue8-
dc.citation.beginningpage1878-
dc.citation.endingpage1889-
dc.citation.publicationnameIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.identifier.doi10.1109/JSSC.2016.2574804-
dc.contributor.localauthorChoi, Jaehyouk-
dc.contributor.nonIdAuthorChoi, Seojin-
dc.contributor.nonIdAuthorYoo, Seyeon-
dc.contributor.nonIdAuthorLim, Younghyun-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorCalibrator-
dc.subject.keywordAuthorclock multiplier-
dc.subject.keywordAuthorfrequency-tracking loop (FTL)-
dc.subject.keywordAuthorinjection-locked-
dc.subject.keywordAuthorjitter-
dc.subject.keywordAuthorphase noise-
dc.subject.keywordAuthorprocess-voltage-temperature (PVT)-
dc.subject.keywordAuthorreal-time-
dc.subject.keywordPlusLOW-POWER-
dc.subject.keywordPlusPLL-
dc.subject.keywordPlusCALIBRATION-
dc.subject.keywordPlusOSCILLATOR-
dc.subject.keywordPlusNOISE-
dc.subject.keywordPlusLOCKING-
dc.subject.keywordPlusDESIGN-
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 60 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0