Industrial Application of Concolic Testing on Embedded Software: Case Studies
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Moonzoo | ko |
| dc.contributor.author | Kim, Yunho | ko |
| dc.contributor.author | Jang, Yoonkyu | ko |
| dc.date.accessioned | 2019-04-16T01:51:49Z | - |
| dc.date.available | 2019-04-16T01:51:49Z | - |
| dc.date.created | 2013-11-12 | - |
| dc.date.created | 2013-11-12 | - |
| dc.date.issued | 2012-04-18 | - |
| dc.identifier.citation | IEEE International Conference on Software Testing, Verification and Validation (ICST) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/259767 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Industrial Application of Concolic Testing on Embedded Software: Case Studies | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-84862327716 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE International Conference on Software Testing, Verification and Validation (ICST) | - |
| dc.identifier.conferencecountry | CN | - |
| dc.contributor.localauthor | Kim, Moonzoo | - |
| dc.contributor.nonIdAuthor | Kim, Yunho | - |
| dc.contributor.nonIdAuthor | Jang, Yoonkyu | - |
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