Fabrication of silicide/silicon hetero-junction Structured Device and Seebeck Coefficient Measurement
- Publisher
- 한국반도체학술대회
- Issue Date
- 2013-02-05
- Language
- Korean
- Citation
제20회 한국반도체학술대회
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.