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Beam propagation analysis on thickness measurements in quantitative phase microscopy Bae, Yoon-Sung; Song, Jong-In; Har, Dongsoo; Kim, Dug Young, OPTICAL REVIEW, v.22, no.4, pp.532 - 538, 2015-08 |
Large step-phase measurement by a reduced-phase triple-illumination interferometer Tayebi, Behnam; Jafarfard, Mohammad Reza; Sharif, Farnaz; Song, Young Sik; Har, Dongsoo; Kim, Dug Young, OPTICS EXPRESS, v.23, no.9, pp.11264 - 11271, 2015-05 |
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