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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

CHARACTERIZATION OF THE ALPHA-SN/CDTE(110) INTERFACE BY ANGLE-RESOLVED X-RAY PHOTOEMISSION

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LIN, TS / PARTIN, WJ / DAMMINGA, GM / PARRILL, TM / Lee, Won-Jongresearcher / CHUNG, YW
Publisher
ELSEVIER SCIENCE BV
Issue Date
1987-04
Language
English
Article Type
Article
Citation

SURFACE SCIENCE, v.183, no.1-2, pp.113 - 122

ISSN
0039-6028
DOI
10.1016/S0039-6028(87)80338-2
URI
http://hdl.handle.net/10203/25291
Appears in Collection
MS-Journal Papers(저널논문)
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