Double-gated ultra-thin-body GaAs-on-insulator p-FETs on Si

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dc.contributor.authorShim, Jae-Philko
dc.contributor.authorKim, Seong Kwangko
dc.contributor.authorKim, Hansungko
dc.contributor.authorJu, Gunwuko
dc.contributor.authorLim, Heejeongko
dc.contributor.authorKim, SangHyeonko
dc.contributor.authorKim, Hyung-junko
dc.date.accessioned2019-02-20T04:57:39Z-
dc.date.available2019-02-20T04:57:39Z-
dc.date.created2019-02-07-
dc.date.issued2018-01-
dc.identifier.citationAPL MATERIALS, v.6, no.1-
dc.identifier.issn2166-532X-
dc.identifier.urihttp://hdl.handle.net/10203/250255-
dc.description.abstractWe demonstrated ultra-thin-body (UTB) junctionless (JL) p-type field-effect transistors (pFETs) on Si using GaAs channels. Wafer bonding and epitaxial lift-off techniques were employed to fabricate the UTB p-GaAs-on-insulator on a Si template. Subsequently, we evaluated the JL FETs having different p-GaAs channel thicknesses considering both maximum depletion width and doping concentration for high performance. Furthermore, by introducing a double-gate operation, we more effectively controlled threshold voltage and attained an even higher I-ON/I-OFF of > 10(6), as well as a low subthreshold swing value of 300 mV/dec. (c) 2018 Author(s).-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.titleDouble-gated ultra-thin-body GaAs-on-insulator p-FETs on Si-
dc.typeArticle-
dc.identifier.wosid000423723700004-
dc.identifier.scopusid2-s2.0-85040567705-
dc.type.rimsART-
dc.citation.volume6-
dc.citation.issue1-
dc.citation.publicationnameAPL MATERIALS-
dc.identifier.doi10.1063/1.5000532-
dc.contributor.nonIdAuthorShim, Jae-Phil-
dc.contributor.nonIdAuthorKim, Seong Kwang-
dc.contributor.nonIdAuthorKim, Hansung-
dc.contributor.nonIdAuthorJu, Gunwu-
dc.contributor.nonIdAuthorLim, Heejeong-
dc.contributor.nonIdAuthorKim, Hyung-jun-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
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