Fault detection and classification using artificial neural networks

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 226
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorHeo, S.ko
dc.contributor.authorLee, Jay Hyungko
dc.date.accessioned2018-12-20T08:07:09Z-
dc.date.available2018-12-20T08:07:09Z-
dc.date.created2018-12-14-
dc.date.created2018-12-14-
dc.date.issued2018-01-
dc.identifier.citationIFAC-PapersOnLine, v.51, no.18, pp.470 - 475-
dc.identifier.issn2405-8963-
dc.identifier.urihttp://hdl.handle.net/10203/248793-
dc.description.abstractProcess monitoring is considered to be one of the most important problems in process systems engineering, which can be benefited significantly from deep learning techniques. In this paper, deep neural networks are applied to the problem of fault detection and classification to illustrate their capability. First, the fault detection and classification problems are formulated as neural network based classification problems. Then, neural networks are trained to perform fault detection, and the effects of two hyperparameters (number of hidden layers and number of neurons in the last hidden layer) and data augmentation on the performance of neural networks are examined. Fault classification problem is also tackled using neural networks with data augmentation. Finally, the results obtained from deep neural networks are compared with other data-driven methods to illustrate the advantages of deep neural networks. © 2018-
dc.languageEnglish-
dc.publisherElsevier B.V.-
dc.titleFault detection and classification using artificial neural networks-
dc.typeArticle-
dc.identifier.scopusid2-s2.0-85054421279-
dc.type.rimsART-
dc.citation.volume51-
dc.citation.issue18-
dc.citation.beginningpage470-
dc.citation.endingpage475-
dc.citation.publicationnameIFAC-PapersOnLine-
dc.identifier.doi10.1016/j.ifacol.2018.09.380-
dc.contributor.localauthorLee, Jay Hyung-
dc.contributor.nonIdAuthorHeo, S.-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorartificial neural network-
dc.subject.keywordAuthordeep learning-
dc.subject.keywordAuthorfault classification-
dc.subject.keywordAuthorfault detection-
dc.subject.keywordPlusDeep learning-
dc.subject.keywordPlusDeep neural networks-
dc.subject.keywordPlusNeural networks-
dc.subject.keywordPlusProcess monitoring-
dc.subject.keywordPlusData augmentation-
dc.subject.keywordPlusData-driven methods-
dc.subject.keywordPlusFault classification-
dc.subject.keywordPlusFault detection and classification-
dc.subject.keywordPlusHidden layers-
dc.subject.keywordPlusHyperparameters-
dc.subject.keywordPlusIn-process-
dc.subject.keywordPlusLearning techniques-
dc.subject.keywordPlusFault detection-
Appears in Collection
CBE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0