Browse "RIMS Collection" by Subject X-ray diffraction

Showing results 1 to 4 of 4

1
Effect of complexing agent on the properties of electrochemically deposited Cu2ZnSnS4 (CZTS) thin films

Pawar, B. S.; Pawar, S. M.; Shin, S. W.; Choi, D. S.; Park, C. J.; Kolekar, S. S.; Kim, J. H., APPLIED SURFACE SCIENCE, v.257, no.5, pp.1786 - 1791, 2010-12

2
Effect of External Pressure and Grain Size on the Phase Transition in the Gd-Doped BaTiO3 Ceramic

y. park; k. cho; Kim, Ho Gi, MATERIALS RESEARCH BULLETIN, v.32, no.11, pp.1485 - 1494, 1997

3
Effect of Substrate Temperature on Structural, Optical and Electrical Properties of Sputtered NiO-Ag Nanocrystalline Thin Films

Reddy, Y. Ashok Kumar; Ajitha, B.; Reddy, P. Sreedhara; Reddy, M. Siva Pratap; Lee, Jung-Hee, ELECTRONIC MATERIALS LETTERS, v.10, no.5, pp.907 - 913, 2014-09

4
Logarithmic dependence of the surface anisotropy on the low-angle X-ray diffraction intensity in Co-based multilayers

Kim, JH; Shin, Sung-Chul, THIN SOLID FILMS, v.301, no.1-2, pp.249 - 252, 1997-06

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