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A physical-based analytical turn-on model of polysilicon thin-film transistors for circuit simulation Yang, GY; Hur, SH; Han, Chul-Hi, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.46, no.1, pp.165 - 172, 1999-01 |
Stability analysis and robust design of polysilicon TFT load 4M SRAM cell by statistical method Lee, GW; Yang, GY; Han, Chul-Hi, QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, v.14, no.5, pp.357 - 364, 1998-09 |
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