Browse "RIMS Collection" by Title 

Showing results 5501 to 5520 of 11393

5501
Physics potential of the International Axion Observatory (IAXO)

Armengaud, E.; Attie, D.; Basso, S.; Brun, P.; Bykovskiy, N.; Carmona, J. M.; Castel, J. F.; et al, JOURNAL OF COSMOLOGY AND ASTROPARTICLE PHYSICS, no.6, 2019-06

5502
Physics' Evolution Toward Computing

Nakamura, Tadao; Nagata, Koji, INTERNATIONAL JOURNAL OF THEORETICAL PHYSICS, v.60, no.1, pp.70 - 79, 2021-01

5503
Phytochemical constituents from the florets of tiger grass Thysanolaena latifolia from Nepal

Shrestha, Sabina; Park, Ji-Hae; Cho, Jin-Gyeong; Lee, Dae-Young; Jeong, Rak-Hun; Song, Myoung-Chong; Cho, Somi Kim; et al, JOURNAL OF ASIAN NATURAL PRODUCTS RESEARCH, v.18, no.2, pp.206 - 213, 2016-02

5504
Phytochemical isolation and biological screening of Cotoneaster microphyllus

Ali, Mumtaz; Ullah, Habib; Ul Bari, Wasim; Ul Islam, Noor; Zahoor, Muhammad; Ullah, Riaz; Bari, Ahmed, INTERNATIONAL JOURNAL OF FOOD PROPERTIES, v.24, no.1, pp.1318 - 1334, 2021-01

5505
PIASy-Mediated Sumoylation of SREBP1c Regulates Hepatic Lipid Metabolism upon Fasting Signaling

Lee, Gha Young; Jang, Hagoon; Lee, Jae Ho; Huh, Jin Young; Choi, Sekyu; Chung, Jongkyeong; Kim, Jae Bum, MOLECULAR AND CELLULAR BIOLOGY, v.34, no.6, pp.926 - 938, 2014-03

5506
Picometre Resolution Measurement of Plasmonic Dynamics in Metal Nanostructures using Frequency Comb

KIM, Young-Jin, Conference on Lasers and Electro-Optics EUROPE (CLEO-Europe) 2019, The Optical Society (OSA), 2019-06-25

5507
Picosecond Laser Damage Mechanism at Semiconductor Surfaces

Jhee, Youn Kyu, In Picosecond Lasers and Applications, SPIE, 1982

5508
PIE: A Holistic Preference Concept and Measurement Model

Kim, Hye-jin; Park, Young-Hoon; Bradlow, Eric T.; Ding, Min, JOURNAL OF MARKETING RESEARCH, v.51, no.3, pp.335 - 351, 2014-06

5509
Piecewise Linear Regression Networks and Its Application to Time Series Prediction

Kil, Rhee Man, IEEE/INNNS international joint Conference on Neural Networks, 1993

5510
Piecewise polynomial models for MOSFET dc characteristics with continuous first order derivative

Jun Young-Hyun; Park, Song Bai, 1988 IEEE International Symposium on Circuits and Systems, Proceedings, v.3, pp.2589 - 2592

5511
Piston guide and magnet assembly for the KRISS watt balance

Kim, Dongmin; Woo, Byung-Chill; Ha, Dokyeong; Lee, SU; Park, HS; Kim, Jinhee; Lee, Kwang-Cheol, 2016 Conference on Precision Electromagnetic Measurements, CPEM 2016, Institute of Electrical and Electronics Engineers Inc., 2016-07

5512
Pitting properties of PACVD TiN coated Inconel 600 in 100℃ NaCl solution

이원종; 천성순; 인치범; 김용일; 김흥회, 한국 원자력 학회 추계 학술 대회, pp.551 - 556, KNS, 1994-10-29

5513
PITTING RESISTANCE OF TIN DEPOSITED ON INCONEL-600 BY PLASMA-ASSISTED CHEMICAL-VAPOR-DEPOSITION

In, C.B.; Kim, S.P.; Kim, Y.I.; Kim, W.W.; Kuk, I.H.; Chun , Soung Soon; Lee, Won-Jong, JOURNAL OF NUCLEAR MATERIALS, v.211, no.3, pp.223 - 230, 1994

5514
pixel arrangement for low-power dot inversion liquid crystal display panels

S-W Lee; J-S Kim; C-H Han, ELECTRONICS LETTERS, v.34, no.16, pp.1604 - 1606, 1998-08

5515
Placegram: A Diagrammatic Map for Personal Geotagged Data Browsing

Jo H.; Ryu J.-H., IEEE TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS, v.16, no.2, pp.221 - 234, 2010

5516
Plama Etching of Copper Films Using Ultra Violet Radiation

Chul-Hi Han, The International Conference on Solid State Devices and Materials, pp.300 - 301, 1997

5517
Planarization and trench filling on severe surface topography with thick photoresist for MEMS

Yoon, Jun-Bo; Oh, G.Y.; Han, Chul-Hi; Yoon, Euisik; Kim, Choong Ki, the SPIE symposium on Micromachining and Microfabrication: Materials and Device Characterization in micromachining, pp.297 - 306, SPIE, 1998-09-21

5518
Planning to Move to Retirement Housing

Gibler, Karen M.; Moschis, George P.; Lee, EueHun, FINANCIAL SERVICES REVIEW, v.7, no.4, pp.291 - 300, 1999-01

5519
Plasma Charging Damage During Over-Etch Time of Aluminum

Hyungcheol Shin; Geunsook Park; Chenming Hu, SOLID-STATE ELECTRONICS, v.42, no.6, pp.911 - 913, 1998-06

5520
Plasma Etching Antenna Effect on Oxide-Silicon Interface Reliability

H. Shin; C. Hu, SOLID-STATE ELECTRONICS, v.36, no.9, pp.1356 - 1358, 1993-02

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