Surface shape measuring device표면 형상 측정기

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A surface shape measuring device includes a substrate, an electrode portion including at least one electrode pattern, the electrode pattern extending on the substrate, a coating layer on the substrate to cover the electrode pattern, and a detector electrically connected to the electrode pattern and detecting a change in a physical quantity of the electrode pattern generated by the deformation of the substrate or the coating layer by an external load applied thereto.
Assignee
KAIST
Country
US (United States)
Issue Date
2015-09-15
Application Date
2013-03-28
Application Number
13852806
Registration Date
2015-09-15
Registration Number
9134211
URI
http://hdl.handle.net/10203/231918
Appears in Collection
BiS-Patent(특허)
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