Surface shape measuring device표면 형상 측정기

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dc.contributor.authorCho, Young Hoko
dc.contributor.authorKim, Jae Minko
dc.contributor.authorSeo, Dae Geonko
dc.date.accessioned2017-12-20T08:35:49Z-
dc.date.available2017-12-20T08:35:49Z-
dc.date.issued2015-09-15-
dc.identifier.urihttp://hdl.handle.net/10203/231918-
dc.description.abstractA surface shape measuring device includes a substrate, an electrode portion including at least one electrode pattern, the electrode pattern extending on the substrate, a coating layer on the substrate to cover the electrode pattern, and a detector electrically connected to the electrode pattern and detecting a change in a physical quantity of the electrode pattern generated by the deformation of the substrate or the coating layer by an external load applied thereto.-
dc.titleSurface shape measuring device-
dc.title.alternative표면 형상 측정기-
dc.typePatent-
dc.type.rimsPAT-
dc.contributor.localauthorCho, Young Ho-
dc.contributor.nonIdAuthorKim, Jae Min-
dc.contributor.nonIdAuthorSeo, Dae Geon-
dc.contributor.assigneeKAIST-
dc.identifier.iprsType특허-
dc.identifier.patentApplicationNumber13852806-
dc.identifier.patentRegistrationNumber9134211-
dc.date.application2013-03-28-
dc.date.registration2015-09-15-
dc.publisher.countryUS-
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BiS-Patent(특허)
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