Surface shape measuring device표면 형상 측정기
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Cho, Young Ho | ko |
| dc.contributor.author | Kim, Jae Min | ko |
| dc.contributor.author | Seo, Dae Geon | ko |
| dc.date.accessioned | 2017-12-20T08:35:49Z | - |
| dc.date.available | 2017-12-20T08:35:49Z | - |
| dc.date.issued | 2015-09-15 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/231918 | - |
| dc.description.abstract | A surface shape measuring device includes a substrate, an electrode portion including at least one electrode pattern, the electrode pattern extending on the substrate, a coating layer on the substrate to cover the electrode pattern, and a detector electrically connected to the electrode pattern and detecting a change in a physical quantity of the electrode pattern generated by the deformation of the substrate or the coating layer by an external load applied thereto. | - |
| dc.title | Surface shape measuring device | - |
| dc.title.alternative | 표면 형상 측정기 | - |
| dc.type | Patent | - |
| dc.type.rims | PAT | - |
| dc.contributor.localauthor | Cho, Young Ho | - |
| dc.contributor.nonIdAuthor | Kim, Jae Min | - |
| dc.contributor.nonIdAuthor | Seo, Dae Geon | - |
| dc.contributor.assignee | KAIST | - |
| dc.identifier.iprsType | 특허 | - |
| dc.identifier.patentApplicationNumber | 13852806 | - |
| dc.identifier.patentRegistrationNumber | 9134211 | - |
| dc.date.application | 2013-03-28 | - |
| dc.date.registration | 2015-09-15 | - |
| dc.publisher.country | US | - |
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