Crack measuring method and apparatus균열 측정 방법 및 측정 장치

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Disclosed are a crack measuring method that may automatically measure crack growth in a surface of a structure rapidly and exactly without influencing the structure using image processing scheme, and an apparatus thereof. The crack measuring method includes: irradiating light to a surface of a structure; converting reflected light, wherein the irradiated light is reflected from the surface of a structure, into an image signal and capturing images of the surface of a structure corresponding to the image signal at predetermined scan intervals through a camera; performing continuously a line scan on the crack parts in the captured images at predetermined scan intervals; and inspecting crack growth in the surface of a structure by identifying pixels with relatively higher or lower light intensity in the scan lines.
Assignee
KAIST
Country
US (United States)
Issue Date
2012-01-10
Application Date
2009-06-02
Application Number
12476874
Registration Date
2012-01-10
Registration Number
08094922
URI
http://hdl.handle.net/10203/231038
Appears in Collection
ME-Patent(특허)
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