Crack measuring method and apparatus균열 측정 방법 및 측정 장치

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dc.contributor.author이정주ko
dc.date.accessioned2017-12-20T04:54:38Z-
dc.date.available2017-12-20T04:54:38Z-
dc.date.issued2012-01-10-
dc.identifier.urihttp://hdl.handle.net/10203/231038-
dc.description.abstractDisclosed are a crack measuring method that may automatically measure crack growth in a surface of a structure rapidly and exactly without influencing the structure using image processing scheme, and an apparatus thereof. The crack measuring method includes: irradiating light to a surface of a structure; converting reflected light, wherein the irradiated light is reflected from the surface of a structure, into an image signal and capturing images of the surface of a structure corresponding to the image signal at predetermined scan intervals through a camera; performing continuously a line scan on the crack parts in the captured images at predetermined scan intervals; and inspecting crack growth in the surface of a structure by identifying pixels with relatively higher or lower light intensity in the scan lines.-
dc.titleCrack measuring method and apparatus-
dc.title.alternative균열 측정 방법 및 측정 장치-
dc.typePatent-
dc.type.rimsPAT-
dc.contributor.localauthor이정주-
dc.contributor.assigneeKAIST-
dc.identifier.iprsType특허-
dc.identifier.patentApplicationNumber12476874-
dc.identifier.patentRegistrationNumber08094922-
dc.date.application2009-06-02-
dc.date.registration2012-01-10-
dc.publisher.countryUS-
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ME-Patent(특허)
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