Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images열전 표면영상 전산모사 방법
A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.
- Assignee
- KAIST
- Country
- US (United States)
- Issue Date
- 2016-10-04
- Application Date
- 2015-07-06
- Application Number
- 14791732
- Registration Date
- 2016-10-04
- Registration Number
- 9459278
- Appears in Collection
- NT-Patent(특허)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.