Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images열전 표면영상 전산모사 방법
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김용현 | ko |
| dc.contributor.author | 여호기 | ko |
| dc.contributor.author | 이의섭 | ko |
| dc.date.accessioned | 2017-12-20T02:11:14Z | - |
| dc.date.available | 2017-12-20T02:11:14Z | - |
| dc.date.issued | 2016-10-04 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/230351 | - |
| dc.description.abstract | A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position. | - |
| dc.title | Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images | - |
| dc.title.alternative | 열전 표면영상 전산모사 방법 | - |
| dc.type | Patent | - |
| dc.type.rims | PAT | - |
| dc.contributor.localauthor | 김용현 | - |
| dc.contributor.nonIdAuthor | 여호기 | - |
| dc.contributor.nonIdAuthor | 이의섭 | - |
| dc.contributor.assignee | KAIST | - |
| dc.identifier.iprsType | 특허 | - |
| dc.identifier.patentApplicationNumber | 14791732 | - |
| dc.identifier.patentRegistrationNumber | 9459278 | - |
| dc.date.application | 2015-07-06 | - |
| dc.date.registration | 2016-10-04 | - |
| dc.publisher.country | US | - |
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