DC Field | Value | Language |
---|---|---|
dc.contributor.author | Nahm, Ho-Hyun | ko |
dc.contributor.author | Kim, Yong-Sung | ko |
dc.date.accessioned | 2017-12-19T03:11:27Z | - |
dc.date.available | 2017-12-19T03:11:27Z | - |
dc.date.created | 2017-12-08 | - |
dc.date.created | 2017-12-08 | - |
dc.date.created | 2017-12-08 | - |
dc.date.issued | 2014-11 | - |
dc.identifier.citation | NPG ASIA MATERIALS, v.6 | - |
dc.identifier.issn | 1884-4049 | - |
dc.identifier.uri | http://hdl.handle.net/10203/228669 | - |
dc.description.abstract | Undercoordinated indium (In*) is found to be an intrinsic defect that acts as a strong electron trap in amorphous InGaZnO4. Conduction electrons couple with the under-coordinated In* via Coulomb attraction, which is the driving force for the formation of an In*-M (M=In, Ga, or Zn) bond. The new structure is stable in the electron-trapped (2-) charge state, and we designate it as an intrinsic (In*-M)(2-) center in amorphous InGaZnO4. The (In*-M)(2-) centers are preferentially formed in heavily n-doped samples, resulting in a doping limit. They are also formed by electrical/optical stresses, which generate excited electrons, resulting in a metastable change in their electrical properties. | - |
dc.language | English | - |
dc.publisher | NATURE PUBLISHING GROUP | - |
dc.subject | GA-ZN-O | - |
dc.subject | THIN-FILM TRANSISTORS | - |
dc.subject | TOTAL-ENERGY CALCULATIONS | - |
dc.subject | WAVE BASIS-SET | - |
dc.subject | OXIDE SEMICONDUCTOR | - |
dc.subject | DX CENTERS | - |
dc.subject | INSTABILITY | - |
dc.subject | ALXGA1-XAS | - |
dc.subject | STRESS | - |
dc.subject | ORIGIN | - |
dc.title | Undercoordinated indium as an intrinsic electron-trap center in amorphous InGaZnO4 | - |
dc.type | Article | - |
dc.identifier.wosid | 000345670900002 | - |
dc.identifier.scopusid | 2-s2.0-84927710649 | - |
dc.type.rims | ART | - |
dc.citation.volume | 6 | - |
dc.citation.publicationname | NPG ASIA MATERIALS | - |
dc.identifier.doi | 10.1038/am.2014.103 | - |
dc.contributor.localauthor | Nahm, Ho-Hyun | - |
dc.contributor.nonIdAuthor | Kim, Yong-Sung | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | GA-ZN-O | - |
dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
dc.subject.keywordPlus | TOTAL-ENERGY CALCULATIONS | - |
dc.subject.keywordPlus | WAVE BASIS-SET | - |
dc.subject.keywordPlus | OXIDE SEMICONDUCTOR | - |
dc.subject.keywordPlus | DX CENTERS | - |
dc.subject.keywordPlus | INSTABILITY | - |
dc.subject.keywordPlus | ALXGA1-XAS | - |
dc.subject.keywordPlus | STRESS | - |
dc.subject.keywordPlus | ORIGIN | - |
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