Metasurface-based Ultra-thin Circular Polarization Analyzer Integrated with Semiconductor

Abstract

We report on a metal-dielectric-metal (MDM) waveguide-based circular polarization analyzer with a sub-micron-scale thickness. By integrating nano-aperture metasurface and semiconductor photodetectors with the MDM structure, we can discriminate the handedness of circularly polarized light directly from the photocurrents without the usage of conventional optical components.