Metasurface-based Ultra-thin Circular Polarization Analyzer Integrated with Semiconductor
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Jung Hoon | ko |
| dc.contributor.author | Yu, Kyoungsik | ko |
| dc.date.accessioned | 2017-12-05T01:30:40Z | - |
| dc.date.available | 2017-12-05T01:30:40Z | - |
| dc.date.created | 2017-11-28 | - |
| dc.date.created | 2017-11-28 | - |
| dc.date.created | 2017-11-28 | - |
| dc.date.issued | 2017-11-22 | - |
| dc.identifier.citation | 22nd Microoptics Conference, MOC 2017, pp.350 - 351 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/227248 | - |
| dc.description.abstract | We report on a metal-dielectric-metal (MDM) waveguide-based circular polarization analyzer with a sub-micron-scale thickness. By integrating nano-aperture metasurface and semiconductor photodetectors with the MDM structure, we can discriminate the handedness of circularly polarized light directly from the photocurrents without the usage of conventional optical components. | - |
| dc.language | English | - |
| dc.publisher | Microoptics Group, JSAP | - |
| dc.title | Metasurface-based Ultra-thin Circular Polarization Analyzer Integrated with Semiconductor | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000427705300160 | - |
| dc.identifier.scopusid | 2-s2.0-85045848721 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 350 | - |
| dc.citation.endingpage | 351 | - |
| dc.citation.publicationname | 22nd Microoptics Conference, MOC 2017 | - |
| dc.identifier.conferencecountry | JA | - |
| dc.identifier.conferencelocation | Convention Hall, Institute of Industrial Science The University of Tokyo | - |
| dc.identifier.doi | 10.23919/MOC.2017.8244629 | - |
| dc.contributor.localauthor | Yu, Kyoungsik | - |
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