Showing results 1 to 3 of 3
Apparatus for detecting sample properties using chaotic wave sensor Park, Yong Keun; Yoon, JongHee; Lee, Kyeoreh; Kim, Young Dug; Kim, Nam Kyun |
Apparatus for Detecting Sample Properties Using Chaotic Wave Sensor Park, Yong Keun; Yoon, JongHee; Lee, KyeoReh; Kim, Young Dug; Kim, Nam Kyun |
Pattern structure inspection device and inspection method Park, Yong Keun; Park, Jongchan; Kim, Young Dug |
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