DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoo, Shin | ko |
dc.contributor.author | Harman, Mark | ko |
dc.date.accessioned | 2017-06-20T01:59:51Z | - |
dc.date.available | 2017-06-20T01:59:51Z | - |
dc.date.created | 2017-06-19 | - |
dc.date.issued | 2007-07-11 | - |
dc.identifier.citation | 2007 ACM International Symposium on Software Testing and Analysis, ISSTA'07 and PADTAD-V Workshop, pp.140 - 150 | - |
dc.identifier.uri | http://hdl.handle.net/10203/224169 | - |
dc.description.abstract | Previous work has treated test case selection as a single objective optimisation problem. This paper introduces the concept of Pareto efficiency to test case selection. The Pareto efficient approach takes multiple objectives such as code coverage, past fault-detection history and execution cost, and constructs a group of non-dominating, equivalently optimal test case subsets. The paper describes the potential bene?ts of Pareto efficient multi-objective test case selection, illustrating with empirical studies of two and three objective formulations. | - |
dc.language | English | - |
dc.publisher | ACM Special Interest Group on Software Engineering (SIGSOFT) | - |
dc.title | Pareto efficient multi-objective test case selection | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 140 | - |
dc.citation.endingpage | 150 | - |
dc.citation.publicationname | 2007 ACM International Symposium on Software Testing and Analysis, ISSTA'07 and PADTAD-V Workshop | - |
dc.identifier.conferencecountry | UK | - |
dc.identifier.conferencelocation | London, United Kingdom | - |
dc.identifier.doi | 10.1145/1273463.1273483 | - |
dc.contributor.localauthor | Yoo, Shin | - |
dc.contributor.nonIdAuthor | Harman, Mark | - |
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