Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms

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dc.contributor.authorKadry, Wisamko
dc.contributor.authorKrestyashyn, Dimtryko
dc.contributor.authorMorgenshtein, Arkadiyko
dc.contributor.authorNahir, Amirko
dc.contributor.authorSokhin, Vitaliko
dc.contributor.authorPark, Jin Sungko
dc.contributor.authorPark, Sung-Boemko
dc.contributor.authorJeong, Wookyeongko
dc.contributor.authorSon, Jae Cheolko
dc.date.accessioned2017-04-17T07:28:39Z-
dc.date.available2017-04-17T07:28:39Z-
dc.date.created2017-04-10-
dc.date.created2017-04-10-
dc.date.created2017-04-10-
dc.date.issued2017-02-
dc.identifier.citationIEEE DESIGN & TEST, v.34, no.1, pp.65 - 76-
dc.identifier.issn2168-2356-
dc.identifier.urihttp://hdl.handle.net/10203/223272-
dc.description.abstractHardware-accelerated simulation platforms can significantly reduce the validation time. This article presents an off-platform test generation method and it compares and contrasts it against the on-platform alternative for two state-of-the-art multicore processor designs.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleTest Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms-
dc.typeArticle-
dc.identifier.wosid000396234500009-
dc.identifier.scopusid2-s2.0-85009950349-
dc.type.rimsART-
dc.citation.volume34-
dc.citation.issue1-
dc.citation.beginningpage65-
dc.citation.endingpage76-
dc.citation.publicationnameIEEE DESIGN & TEST-
dc.identifier.doi10.1109/MDAT.2016.2527998-
dc.contributor.localauthorSon, Jae Cheol-
dc.contributor.nonIdAuthorKadry, Wisam-
dc.contributor.nonIdAuthorKrestyashyn, Dimtry-
dc.contributor.nonIdAuthorMorgenshtein, Arkadiy-
dc.contributor.nonIdAuthorNahir, Amir-
dc.contributor.nonIdAuthorSokhin, Vitali-
dc.contributor.nonIdAuthorPark, Jin Sung-
dc.contributor.nonIdAuthorPark, Sung-Boem-
dc.contributor.nonIdAuthorJeong, Wookyeong-
dc.description.isOpenAccessN-
dc.type.journalArticleEditorial Material-
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RIMS Journal Papers
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