Charge gradient microscopy

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dc.contributor.authorHong, Seungbumko
dc.contributor.authorTong, Shengko
dc.contributor.authorPark, Woon Ikko
dc.contributor.authorHiranaga, Yoshiomiko
dc.contributor.authorCho, Yasuoko
dc.contributor.authorRoelofs, Andreasko
dc.date.accessioned2017-02-02T01:52:25Z-
dc.date.available2017-02-02T01:52:25Z-
dc.date.created2017-01-17-
dc.date.created2017-01-17-
dc.date.created2017-01-17-
dc.date.created2017-01-17-
dc.date.issued2014-05-
dc.identifier.citationPROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, v.111, no.18, pp.6566 - 6569-
dc.identifier.issn0027-8424-
dc.identifier.urihttp://hdl.handle.net/10203/220257-
dc.description.abstractHere we present a simple and fast method to reliably image polarization charges using charge gradient microscopy (CGM). We collected the current from the grounded CGM probe while scanning a periodically poled lithium niobate single crystal and single-crystal LiTaO3 thin film on the Cr electrode. We observed current signals at the domains and domain walls originating from the displacement current and the relocation or removal of surface charges, which enabled us to visualize the ferroelectric domains at a scan frequency above 78 Hz over 10 mu m. We envision that CGM can be used in high-speed ferroelectric domain imaging and piezoelectric energy-harvesting devices.-
dc.languageEnglish-
dc.publisherNATL ACAD SCIENCES-
dc.titleCharge gradient microscopy-
dc.typeArticle-
dc.identifier.wosid000335477300028-
dc.identifier.scopusid2-s2.0-84899824466-
dc.type.rimsART-
dc.citation.volume111-
dc.citation.issue18-
dc.citation.beginningpage6566-
dc.citation.endingpage6569-
dc.citation.publicationnamePROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA-
dc.identifier.doi10.1073/pnas.1324178111-
dc.contributor.localauthorHong, Seungbum-
dc.contributor.nonIdAuthorTong, Sheng-
dc.contributor.nonIdAuthorPark, Woon Ik-
dc.contributor.nonIdAuthorHiranaga, Yoshiomi-
dc.contributor.nonIdAuthorCho, Yasuo-
dc.contributor.nonIdAuthorRoelofs, Andreas-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorscreen charge-
dc.subject.keywordAuthoratomic force microscopy-
dc.subject.keywordAuthorpiezoresponse-
dc.subject.keywordAuthorcharge scraping-
dc.subject.keywordPlusOPTICAL COHERENCE TOMOGRAPHY-
dc.subject.keywordPlusFORCE MICROSCOPY-
dc.subject.keywordPlus180-DEGREES-
dc.subject.keywordPlusINTEGRATION-
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