A new resistive probe with higher resolution
We have proposed a new apex shaped semiconductor probe with resistive tip. Its improved characteristics are shown by using three-dimensional simulation tool (SILVACOtrade).
- Publisher
- IEEE Nanotechnology Council
- Issue Date
- 2006-10
- Language
- English
- Citation
2006 IEEE Nanotechnology Materials and Devices Conference, pp.114 - 115
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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