A new resistive probe with higher resolution

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dc.contributor.authorLee, Jaehong-
dc.contributor.authorHong, Daniel Seungbum-
dc.contributor.authorJung, Juhwan-
dc.contributor.authorPark, Byung-Gook-
dc.contributor.authorLee, Jong Duk-
dc.contributor.authorShin, Hyungcheol-
dc.date.accessioned2017-01-19T01:16:21Z-
dc.date.available2017-01-19T01:16:21Z-
dc.date.created2017-01-18-
dc.date.issued2006-10-
dc.identifier.citation2006 IEEE Nanotechnology Materials and Devices Conference, pp.114 - 115-
dc.identifier.urihttp://hdl.handle.net/10203/220074-
dc.description.abstractWe have proposed a new apex shaped semiconductor probe with resistive tip. Its improved characteristics are shown by using three-dimensional simulation tool (SILVACOtrade).-
dc.languageEnglish-
dc.publisherIEEE Nanotechnology Council-
dc.titleA new resistive probe with higher resolution-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage114-
dc.citation.endingpage115-
dc.citation.publicationname2006 IEEE Nanotechnology Materials and Devices Conference-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationGyeongju, Korea-
dc.identifier.doi10.1109/NMDC.2006.4388710-
dc.contributor.localauthorHong, Daniel Seungbum-
dc.contributor.nonIdAuthorLee, Jaehong-
dc.contributor.nonIdAuthorJung, Juhwan-
dc.contributor.nonIdAuthorPark, Byung-Gook-
dc.contributor.nonIdAuthorLee, Jong Duk-
dc.contributor.nonIdAuthorShin, Hyungcheol-
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MS-Conference Papers(학술회의논문)
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