DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Jaehong | - |
dc.contributor.author | Hong, Daniel Seungbum | - |
dc.contributor.author | Jung, Juhwan | - |
dc.contributor.author | Park, Byung-Gook | - |
dc.contributor.author | Lee, Jong Duk | - |
dc.contributor.author | Shin, Hyungcheol | - |
dc.date.accessioned | 2017-01-19T01:16:21Z | - |
dc.date.available | 2017-01-19T01:16:21Z | - |
dc.date.created | 2017-01-18 | - |
dc.date.issued | 2006-10 | - |
dc.identifier.citation | 2006 IEEE Nanotechnology Materials and Devices Conference, pp.114 - 115 | - |
dc.identifier.uri | http://hdl.handle.net/10203/220074 | - |
dc.description.abstract | We have proposed a new apex shaped semiconductor probe with resistive tip. Its improved characteristics are shown by using three-dimensional simulation tool (SILVACOtrade). | - |
dc.language | English | - |
dc.publisher | IEEE Nanotechnology Council | - |
dc.title | A new resistive probe with higher resolution | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 114 | - |
dc.citation.endingpage | 115 | - |
dc.citation.publicationname | 2006 IEEE Nanotechnology Materials and Devices Conference | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Gyeongju, Korea | - |
dc.identifier.doi | 10.1109/NMDC.2006.4388710 | - |
dc.contributor.localauthor | Hong, Daniel Seungbum | - |
dc.contributor.nonIdAuthor | Lee, Jaehong | - |
dc.contributor.nonIdAuthor | Jung, Juhwan | - |
dc.contributor.nonIdAuthor | Park, Byung-Gook | - |
dc.contributor.nonIdAuthor | Lee, Jong Duk | - |
dc.contributor.nonIdAuthor | Shin, Hyungcheol | - |
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