Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography

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In many cases, the three-dimensional reconstructions from atom probe tomography (APT) are not sufficiently accurate to resolve crystallographic features such as lattice planes, shear bands, stacking faults, dislocations or grain boundaries. Hence, correlative crystallographic characterization is required in addition to APT at the exact same location of the specimen. Also, for the site-specific preparation of APT tips containing regions of interest (e.g. grain boundaries) correlative electron microscopy is often inevitable. Here we present a versatile experimental setup that enables performing correlative focused ion beam milling, transmission electron microscopy (TEM), and APT under optimized characterization conditions. The setup was designed for high throughput, robustness and practicability. We demonstrate that atom probe tips can be characterized by TEM in the same way as a standard TEM sample. In particular, the use of scanning nanobeam diffraction provides valuable complementary crystallographic information when being performed on atom probe tips. This technique enables the measurement of orientation and phase maps as known from electron backscattering diffraction with a spatial resolution down to one nanmeter. (C) 2015 Elsevier B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE BV
Issue Date
2015-06
Language
English
Article Type
Article
Keywords

FIELD-ION-MICROSCOPE; GRAIN-BOUNDARY SEGREGATION; ORIENTATION; STEEL; DIFFRACTION; SPECIMENS; ALLOYS; TRANSFORMATION; DEFORMATION; MARTENSITE

Citation

ULTRAMICROSCOPY, v.153, pp.32 - 39

ISSN
0304-3991
DOI
10.1016/j.ultramic.2015.02.003
URI
http://hdl.handle.net/10203/218345
Appears in Collection
MS-Journal Papers(저널논문)
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