A NEW EXPERIMENTAL-METHOD (E-PLOT) TO CHARACTERIZE THE SUBSTRATE-CURRENT AND THE SATURATION-VOLTAGE OF FRESH AND HOT-ELECTRON-DAMAGED NMOSFETS
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Issue Date
- 1994-01
- Language
- English
- Article Type
- Note
- Keywords
DEGRADATION; MOSFETS; MODEL
- Citation
SOLID-STATE ELECTRONICS, v.37, no.1, pp.198 - 200
- ISSN
- 0038-1101
- Appears in Collection
- EE-Journal Papers(저널논문)
- Files in This Item
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