DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Jung Min | ko |
dc.contributor.author | Choi, Chul Min | ko |
dc.contributor.author | Sukegawa, Hiroaki | ko |
dc.contributor.author | Lee, Jeong Yong | ko |
dc.contributor.author | Mitani, Seiji | ko |
dc.contributor.author | Song, Yun-Heub | ko |
dc.date.accessioned | 2016-06-07T09:00:46Z | - |
dc.date.available | 2016-06-07T09:00:46Z | - |
dc.date.created | 2016-03-14 | - |
dc.date.created | 2016-03-14 | - |
dc.date.issued | 2016-01 | - |
dc.identifier.citation | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.1, pp.654 - 657 | - |
dc.identifier.issn | 1533-4880 | - |
dc.identifier.uri | http://hdl.handle.net/10203/207682 | - |
dc.description.abstract | We investigated how surface roughness of a Ta/Ru buffer layer affects the degradation characteristics on MgO-based magnetic tunnel junctions (MTJs). MTJs with worse surface roughness on the buffer layer showed increased resistance drift and degraded time-dependent dielectric breakdown (TDDB) characteristics. We suggest that this resulted from reduced MgO thickness on the MTJ with worse surface roughness on the buffer layer, which was estimated by the TDDB and analytic approach. As a result, surface roughness of the buffer layer is a critical factors that impacts the reliability of MTJs, and it should be controlled to have the smallest roughness value as possible. | - |
dc.language | English | - |
dc.publisher | AMER SCIENTIFIC PUBLISHERS | - |
dc.title | Degradation Characteristics of MgO Based Magnetic Tunnel Junction Caused by Surface Roughness of Ta/Ru Buffer Layers | - |
dc.type | Article | - |
dc.identifier.wosid | 000369680400074 | - |
dc.identifier.scopusid | 2-s2.0-84959331265 | - |
dc.type.rims | ART | - |
dc.citation.volume | 16 | - |
dc.citation.issue | 1 | - |
dc.citation.beginningpage | 654 | - |
dc.citation.endingpage | 657 | - |
dc.citation.publicationname | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | - |
dc.identifier.doi | 10.1166/jnn.2016.11901 | - |
dc.contributor.localauthor | Lee, Jeong Yong | - |
dc.contributor.nonIdAuthor | Lee, Jung Min | - |
dc.contributor.nonIdAuthor | Choi, Chul Min | - |
dc.contributor.nonIdAuthor | Sukegawa, Hiroaki | - |
dc.contributor.nonIdAuthor | Mitani, Seiji | - |
dc.contributor.nonIdAuthor | Song, Yun-Heub | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Magnetic Tunnel Junction | - |
dc.subject.keywordAuthor | MgO | - |
dc.subject.keywordAuthor | Degradation | - |
dc.subject.keywordAuthor | Breakdown | - |
dc.subject.keywordAuthor | Buffer Layer | - |
dc.subject.keywordAuthor | Surface Roughness | - |
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