8.5 BUFFER SOLUTION; SULFURIC-ACID-SOLUTION; POINT-DEFECT MODEL; FE-CR ALLOYS; IN-SITU; SEMICONDUCTIVE PROPERTIES; STAINLESS-STEELS; HIGH-TEMPERATURE; OXIDE-FILMS; TRANSIENT PHOTOCURRENTS
JOURNAL OF SOLID STATE ELECTROCHEMISTRY, v.19, no.12, pp.3427 - 3438
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