Ask the Mutants: Mutation Faulty Programs for Fault Localization

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dc.contributor.authorMoon, Seokhyun-
dc.contributor.authorKim, Yoonho-
dc.contributor.authorKim, Moonzoo-
dc.contributor.authorYoo, Shin-
dc.date.accessioned2016-05-12T03:47:36Z-
dc.date.available2016-05-12T03:47:36Z-
dc.date.created2016-01-06-
dc.date.issued2014-04-02-
dc.identifier.citationInternational Conference on Software Testing, Verification and Validation (ICST), pp.153 - 162-
dc.identifier.urihttp://hdl.handle.net/10203/207287-
dc.description.abstractWe present MUSE (MUtation-baSEd fault localization technique), a new fault localization technique based on mutation analysis. A key idea of MUSE is to identify a faulty statement by utilizing different characteristics of two groups of mutants-one that mutates a faulty statement and the other that mutates a correct statement. We also propose a new evaluation metric for fault localization techniques based on information theory, called Locality Information Loss (LIL): it can measure the aptitude of a localization technique for automated fault repair systems as well as human debuggers. The empirical evaluation using 14 faulty versions of the five real-world programs shows that MUSE localizes a fault after reviewing 7.4 statements on average, which is about 25 times more precise than the state-of-the-art SBFL technique Op2-
dc.languageEnglish-
dc.publisherIEEE Computer Society-
dc.titleAsk the Mutants: Mutation Faulty Programs for Fault Localization-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage153-
dc.citation.endingpage162-
dc.citation.publicationnameInternational Conference on Software Testing, Verification and Validation (ICST)-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationCleveland, USA-
dc.contributor.localauthorKim, Yoonho-
dc.contributor.localauthorKim, Moonzoo-
dc.contributor.nonIdAuthorMoon, Seokhyun-
dc.contributor.nonIdAuthorYoo, Shin-
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CS-Conference Papers(학술회의논문)
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