DC Field | Value | Language |
---|---|---|
dc.contributor.author | You, CY | ko |
dc.contributor.author | Shin, Sung-Chul | ko |
dc.date.accessioned | 2010-11-30T01:56:49Z | - |
dc.date.available | 2010-11-30T01:56:49Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996-05 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, v.68, no.20, pp.2882 - 2884 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10203/20512 | - |
dc.description.abstract | In addition to the measurement of the Kerr rotation angle, the measurement of the ellipticity is generally known to be necessary for determining the off-diagonal element of the dielectric tenser. We have found a new method for determining the off-diagonal element of the dielectric tensor, without measuring the ellipticity, for a sample deposited on a transparent substrate. (C) 1996 American Institute of Physics. | - |
dc.description.sponsorship | This work was supported by the Ministry of Science and Technology of Korea. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Determination of the off-diagonal element of the dielectric tensor without measuring the ellipticity | - |
dc.type | Article | - |
dc.identifier.wosid | A1996UK56900037 | - |
dc.identifier.scopusid | 2-s2.0-5544253483 | - |
dc.type.rims | ART | - |
dc.citation.volume | 68 | - |
dc.citation.issue | 20 | - |
dc.citation.beginningpage | 2882 | - |
dc.citation.endingpage | 2884 | - |
dc.citation.publicationname | APPLIED PHYSICS LETTERS | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Shin, Sung-Chul | - |
dc.contributor.nonIdAuthor | You, CY | - |
dc.type.journalArticle | Article | - |
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