Determination of the off-diagonal element of the dielectric tensor without measuring the ellipticity

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dc.contributor.authorYou, CYko
dc.contributor.authorShin, Sung-Chulko
dc.date.accessioned2010-11-30T01:56:49Z-
dc.date.available2010-11-30T01:56:49Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1996-05-
dc.identifier.citationAPPLIED PHYSICS LETTERS, v.68, no.20, pp.2882 - 2884-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10203/20512-
dc.description.abstractIn addition to the measurement of the Kerr rotation angle, the measurement of the ellipticity is generally known to be necessary for determining the off-diagonal element of the dielectric tenser. We have found a new method for determining the off-diagonal element of the dielectric tensor, without measuring the ellipticity, for a sample deposited on a transparent substrate. (C) 1996 American Institute of Physics.-
dc.description.sponsorshipThis work was supported by the Ministry of Science and Technology of Korea.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherAMER INST PHYSICS-
dc.titleDetermination of the off-diagonal element of the dielectric tensor without measuring the ellipticity-
dc.typeArticle-
dc.identifier.wosidA1996UK56900037-
dc.identifier.scopusid2-s2.0-5544253483-
dc.type.rimsART-
dc.citation.volume68-
dc.citation.issue20-
dc.citation.beginningpage2882-
dc.citation.endingpage2884-
dc.citation.publicationnameAPPLIED PHYSICS LETTERS-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorShin, Sung-Chul-
dc.contributor.nonIdAuthorYou, CY-
dc.type.journalArticleArticle-
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