Browse "RIMS Journal Papers" by Author Wi, BR

Showing results 1 to 1 of 1

1
Defect creation in a-Si:H thin film transistors by bias-stress

Wi, BR; Lee, WH; Lee, C; Shin, Sung-Chul, JAPANESE JOURNAL OF APPLIED PHYSICS, v.36, no.5A, pp.536 - 539, 1997-05

Discover

Type

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0