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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

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dc.contributor.authorShin, Jae-Heonko
dc.contributor.authorLee, Ji-Suko
dc.contributor.authorHwang, Chi-Sunko
dc.contributor.authorPark, Sang-Hee Koko
dc.contributor.authorCheong, Woo-Seokko
dc.contributor.authorRyu, Minkiko
dc.contributor.authorByun, Chun-Wonko
dc.contributor.authorLee, Jeong-Ikko
dc.contributor.authorChu, Hye Yongko
dc.date.accessioned2015-11-20T12:54:33Z-
dc.date.available2015-11-20T12:54:33Z-
dc.date.created2014-04-21-
dc.date.created2014-04-21-
dc.date.issued2009-02-
dc.identifier.citationETRI JOURNAL, v.31, no.1, pp.62 - 64-
dc.identifier.issn1225-6463-
dc.identifier.urihttp://hdl.handle.net/10203/201766-
dc.description.abstractWe report on the bias stability characteristics of transparent ZnO thin film transistors (TFTs) under visible light illumination. The transfer curve shows virtually no change under positive gate bias stress with light illumination, while it shows dramatic negative shy under negative gate bias stress. The major mechanism of the bias stability under visible illumination of our ZnO The is thought to be the charge trapping of photo-generated holes at the gate insulator and/or insulator/channel interface.-
dc.languageEnglish-
dc.publisherELECTRONICS TELECOMMUNICATIONS RESEARCH INST-
dc.subjectPHYSICS-
dc.titleLight Effects on the Bias Stability of Transparent ZnO Thin Film Transistors-
dc.typeArticle-
dc.identifier.wosid000263319200007-
dc.identifier.scopusid2-s2.0-61349167819-
dc.type.rimsART-
dc.citation.volume31-
dc.citation.issue1-
dc.citation.beginningpage62-
dc.citation.endingpage64-
dc.citation.publicationnameETRI JOURNAL-
dc.identifier.doi10.4218/etrij.09.0208.0266-
dc.contributor.localauthorPark, Sang-Hee Ko-
dc.contributor.nonIdAuthorShin, Jae-Heon-
dc.contributor.nonIdAuthorLee, Ji-Su-
dc.contributor.nonIdAuthorHwang, Chi-Sun-
dc.contributor.nonIdAuthorCheong, Woo-Seok-
dc.contributor.nonIdAuthorRyu, Minki-
dc.contributor.nonIdAuthorByun, Chun-Won-
dc.contributor.nonIdAuthorLee, Jeong-Ik-
dc.contributor.nonIdAuthorChu, Hye Yong-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorZnO-
dc.subject.keywordAuthortransparent oxide semiconductor-
dc.subject.keywordAuthorthin film transistor (TFT)-
dc.subject.keywordAuthorbias stability-
dc.subject.keywordAuthorlight effect-
dc.subject.keywordPlusPHYSICS-
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