Browse "School of Electrical Engineering(전기및전자공학부)" by Title
Showing results 11021 to 11040 of 50978
| Characterization of current injection mechanism in Schottky-barrier metal-oxide-semiconductor field-effect transistors Choi, Sung-Jin; Han, Jin-Woo; Jang, Moon-Gyu; Choi, Chel-Jong; Choi, Yang-Kyu, APPLIED PHYSICS LETTERS, v.95, no.8, 2009-08 |
| Characterization of CVD grown graphene with various etchants Choi, HongKyw; Jeong, Hu Young; Kim, Jae Hyun; Choi, Sung-Yool, NANO KOREA 2011, NANO KOREA 2011, 2011-08-24 |
| characterization of diffision processes with spin-on sourceslink Chung, Tae-Won; 정태원; et al, 한국과학기술원, 1978 |
| Characterization of diodes for integrated circuits = 집적회로 내의 다이오드의 전기적 특성 연구link Kwon, Oh-Hyun; 권오현; et al, 한국과학기술원, 1977 |
| Characterization of Directly Modulated Self-Seeded Reflective Semiconductor Optical Amplifiers Utilized as Colorless Transmitters in WDM-PONs Xiong, Fei; Zhong, Wen-De; Zhu, Min; Kim, Hoon; Xu, Zhiguang; Liu, Dekun, JOURNAL OF LIGHTWAVE TECHNOLOGY, v.31, no.11, pp.1727 - 1733, 2013-06 |
| Characterization of extended width optical dipole antennas Seok, T.J.; Jamshidi, A.; Lakhani, A.; Yu, Kyoungsik; Choo, H.; Miller, O.; Yablonovitch, E.; et al, Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on , pp.CFI4 -, CLEO, 2010-05-16 |
| Characterization of Fe-catalyzed carbon nanotubes grown by thermal chemical vapor deposition Park, JB; Choi, GS; Cho, YS; Hong, SY; Kim, D; Choi, Sung-Yool; Lee, JH; et al, JOURNAL OF CRYSTAL GROWTH, v.244, no.2, pp.211 - 217, 2002-10 |
| Characterization of femtosecond laser filament-fringes in titanium Ahsan, Md. Shamim; Dewanda, Fadia; Ahmed, Farid; Jun, Martin B. G.; Lee, Man Seop, SPIE Photonics West 2013, pp.86111I-1 - 86111I-9, SPIE, 2013-02-02 |
| Characterization of femtosecond laser filamentation in soda-lime glass Ahsan, Md. Shamim; Rafi, Ragib Shakil; Sohn, Ik-Bu; Choi, Hun-Kook; Lee, Man-Seop, 2nd International Conference on Electrical Engineering and Information and Communication Technology, iCEEiCT 2015, Institute of Electrical and Electronics Engineers Inc., 2015-05 |
| Characterization of gradually doped LWIR diodes by hydrogenation Lee, Hee Chul, pp.0 - 0, 1999-09-01 |
| Characterization of Hazardous Gases Using an Infrared Hyperspectral Imaging System Lee, Jai-Hoon; Yu, Hyeong-Geun; Park, Dong-Jo; Park, Byeong Hwang; Kim, Ju Hyun, INSTRUMENTATION SCIENCE & TECHNOLOGY, v.43, no.4, pp.469 - 484, 2015-07 |
| Characterization of high quality nitrided gate dielectric films manufactured in reduced pressure furnace for ULSI CMOS applications Yoon, Giwan, Electrochemical Society Meeting Proceeding (Montreal, Canada), 1997 Spring, pp.418 - 429, Electrochemical Society Meeting Proceeding (Montreal, Canada), 1997 Spring, 1997-04 |
| Characterization of high quality nitrided gate dielectric films manufactured in reduced pressure furnace for ultralarge scale integration complementary metal oxide semiconductor applications Yoon, Giwan; Epstein, Y, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.145, no.5, pp.1679 - 1683, 1998-05 |
| Characterization of high-frequency plane-to-plane coupling through cutout in multi-layer packages Lee, J.; Seng, Y.M.; Rotaru, M.D.; Iyer, M.K.; Kim, Joungho, 53rd Electronic Components and Technology Conference 2003, pp.1589 - 1593, IEEE, 2003-05-27 |
| Characterization of impurity profile in silicon = 실리콘에서 불순물 분포의 산출link Yang, Yeong-Yil; 양영일; et al, 한국과학기술원, 1985 |
| Characterization of Inter-Cell Interference in 3D NAND Flash Memory Park, Suk Kwang; Moon, Jaekyun, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.68, no.3, pp.1183 - 1192, 2021-01 |
Characterization of intrinsic subgap density-of-states in exfoliated MoS2 FETs using a multi-frequency capacitance-conductance technique Bae, Hagyoul; Kim, Choong-Ki; Choi, Yang-Kyu, AIP ADVANCES, v.7, no.7, 2017-07 |
| CHARACTERIZATION OF ION-BEAM DEPOSITED REFRACTORY WNX FILMS ON GAAS Lee, JS; Park, Chul Soon; Kang, JY; Ma, DS; Lee, Jeong Yong, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.8, no.5, pp.1117 - 1121, 1990-10 |
| Characterization of lo leakage behavior in transconductance mixers Le, V.H.; Tran, Q.K.; Han, S.K.; Lee, Sang-Gug, 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC, pp.461 - 464, 2005-12-19 |
| Characterization of LO leakage behavior in Transconductance Mixers Lee, Sang-Gug, 2005 IEEE International Conference on Electron Devices and Solid-State Circuits, v.0, no.0, pp.19 - 21, 2005 IEEE International Conference on Electron Devices and Solid-State Circuits, 2005-12-01 |
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