Browse "School of Electrical Engineering(전기및전자공학부)" by Subject floating-body
Showing results 1 to 4 of 4
| A comprehensive modeling of dynamic negative-bias temperature instability in PMOS body-tied FinFETs Lee, H; Lee, CH; Park, D; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.27, no.4, pp.281 - 283, 2006-04 |
| Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12 |
| Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage Park, Jun-Young; Hur, Jae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.180 - 183, 2018-02 |
| Fully Depleted Polysilicon TFTs for Capacitorless 1T-DRAM Han, Jin-Woo; Ryu, Seong-Wan; Kim, Dong-Hyun; Kim, Chung-Jin; Kim, Sung-Ho; Moon, Dong-Il; Choi, Sung-Jin; et al, IEEE ELECTRON DEVICE LETTERS, v.30, no.7, pp.742 - 744, 2009-07 |
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