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Browse "School of Electrical Engineering(전기및전자공학부)" by Subject 웨이퍼 검사 공정▼a웨이퍼 맵▼a불량 패턴 분류▼a경량 합성곱 신경망

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반도체 웨이퍼 빈 맵 분류를 위한 효율적인 합성곱 신경망 = Efficient convolutional neural networks for semiconductor wafer bin map classificationlink

신은미; 유창동; et al, 한국과학기술원, 2023

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