학위논문(석사) - 한국과학기술원 : 전기및전자공학부, 2023.2,[v, 45 p. :]
웨이퍼 검사 공정▼a웨이퍼 맵▼a불량 패턴 분류▼a경량 합성곱 신경망; Wafer test process▼aWafer map▼aDefect pattern classification▼aLight-weight convolutional neural networks
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