Browse "School of Electrical Engineering(전기및전자공학부)" by Author Oh, Jae Sub
Showing results 1 to 7 of 7
| Crystallized HfLaO embedded tetragonal ZrO2 for dynamic random access memory capacitor dielectrics Shin, Yunsang; Min, Kyung Kyu; Lee, Seok-Hee; Lim, Sung Kyu; Oh, Jae Sub; Lee, Kee-Jeung; Hong, Kwon; et al, APPLIED PHYSICS LETTERS, v.98, no.17, 2011-04 |
| Gate-All-Around Silicon Nanowire MOSFETs on Bulk Substrate Choi, Yang-Kyu; Han, Jin-Woo; Ryu, Seong-Wan; Kim, Sungho; Kim, Chung-Jin; Ahn, Jae-Hyuk; Choi, Sung-Jin; et al, The 16th Korean Conference on Semiconductors, pp.648 - 649, 2009-02 |
| Improvement of Charge Retention in Flash Memory Devices by Very Light Doping of Lanthanum into an Aluminum-Oxide Blocking Layer Park, Jong Kyung; Lee, Seok-Hee; Oh, Jae Sub; Lee, Ki-Hong; Pyi, Seung Ho; Cho, Byung Jin, APPLIED PHYSICS EXPRESS, v.5, no.8, 2012-08 |
| Mechanical and Electrical Reliability Analysis of Flexible Si Complementary Metal-Oxide-Semiconductor Integrated Circuit Kim, Seungyoon; Kim, Cheolgyu; Bong, Jae Hoon; Hwang, Wan Sik; Kim, Taek-Soo; Oh, Jae Sub; Cho, Byung Jin, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.19, no.10, pp.6473 - 6480, 2019-10 |
| Multi-Functional Universal Device using a Band-Engineered Vertical Structure Moon, Dong Il; Oh, Jae Sub; Choi, Sung Jin; Kim, Sungho; Kim, Jee Yeon; Kim, Moon Seok; Kim, Young Su; et al, 57th IEEE International Electron Device Meeting (IEDM), pp.551 - 554, IEEE, 2011-12-07 |
| Sub-5nm All-Around Gate FinFET for Ultimate Scaling Lee, Hyunjin; Yu, Lee-Eun; Ryu, Seong-Wan; Han, Jin-Woo; Jeon, Kanghoon; Jang, Dong-Yoon; Kim, Kuk-Hwan; et al, IEEE Symposium on VLSI Technology Digest of Technical Papaers, pp. 70-71, 2006-06-13 |
| Vacuum gate dielectric gate-all-around nanowire for hot carrier injection and bias temperature instability free transistor Han, Jin-Woo; Moon, Dong-Il; Oh, Jae Sub; Choi, Yang-Kyu; Meyyappan, M., APPLIED PHYSICS LETTERS, v.104, no.25, 2014-06 |
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