Browse "School of Electrical Engineering(전기및전자공학부)" by Author Lee Jung-Yeal
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| ECR plasma oxidation effects on performance and stability of polysilicon thin film transistors Lee Jung-Yeal; Han Chul-Hi; Kim, Choong Ki, Proceedings of the 1994 IEEE International Electron Devices Meeting, pp.523 - 526, 1994-12-11 |
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