Showing results 2 to 4 of 4
SIMOX 웨이퍼를 이용한 silicon-on-insulator MOSFET소자의 제작 및 특성 분석 = Fabrication and characterization of silicon-on-insulator MOSFETs using SIMOX waferslink 이호준; Lee, Ho-Jun; et al, 한국과학기술원, 1991 |
Suppression of misfit dislocations in heavily boron-doped silicon layer for micro-machining = 마이크로-머시닝을 위한 고농도로 붕소가 도핑된 실리콘층의 부정합 전위의 억제link Lee, Ho-Jun; 이호준; et al, 한국과학기술원, 1996 |
X-ray irradiation induced damage in MOS structures and it's effect on oxide reliability Lee, Kwyro; Han, Chul-Hi; Kim, Shi-Ho; Lee, Ho-Jun; Choi, Sang-Soo; Jeon, Young-Jin; Fabrizio, Enzo Di; et al, Technical Digest of 3rd International Conference on VLSI and CAD, pp.20 - 23, 1993 |
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