Suppression of misfit dislocations in heavily boron-doped silicon layer for micro-machining마이크로-머시닝을 위한 고농도로 붕소가 도핑된 실리콘층의 부정합 전위의 억제

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 397
  • Download : 0
It has been found that the misfit dislocations in heavily boron-doped silicon layers which are useful materials in micro-machining are originated from the wafer edge, where the boron-doped layers were formed by thermal diffusion. And, a heavily boron-doped silicon region which is free of misfit dislocation has been obtained by surrounding the region with an undoped region which prevents the propagation of the misfit dislocations from the wafer edge. The surrounding undoped region using chemical vapor deposited oxide can suppress effectively the misfit dislocations, while many misfit dislocations are usually generated in the heavily boron-doped regions surrounded by the undoped regions using the thermal oxide and low-pressured chemical vapor deposited nitride due to the oxidation-induced stacking faults and half-loop dislocations, respectively. In the case of chemical vapor deposited oxide, well aligning of the surrounding undoped region to [110] direction as well as large width of the region is very critical for the suppression of the misfit dislocations because misfit dislocations can penetrate with climb motion through a tilted undoped region to [110] direction due to the tensile stress in the region induced from the boron-doped regions, while the induced tensile stress in the well aligned undoped region is relaxed by the $60^\circ$ dislocations in the region. Using the heavily boron-doped silicon layer without misfit dislocations, heavily boron-doped silicon membranes which are free of misfit dislocation have been fabricated. The surface roughness of the dislocation-free membrane at the etch-stopped surface have been measured as small as 20 \AA peak-to-peak, while that of the conventional membrane which contains many misfit dislocations as 500 \AA peak-to-peak. Using blister test, the fracture strength and residual tensile stress of the dislocation-free membrane have been extracted as high as $1.39 \times 10^{10} dyne/cm^2$ and $2.7 \times 10^9 dyne/cm^2$, w...
Advisors
Kim, Choong-Ki김충기
Description
한국과학기술원 : 전기 및 전자공학과,
Publisher
한국과학기술원
Issue Date
1996
Identifier
106523/325007 / 000895414
Language
eng
Description

학위논문(박사) - 한국과학기술원 : 전기 및 전자공학과, 1996.2, [ iv, 130 p. ]

URI
http://hdl.handle.net/10203/36334
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=106523&flag=dissertation
Appears in Collection
EE-Theses_Ph.D.(박사논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0