Browse "School of Electrical Engineering(전기및전자공학부)" by Author Im, Sung-Gap
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| Negative Bias Illumination Stress(NBIS) Stability Analysis of MoS2 Thin-Film Transistor(TFT) Oh, Dong-Sik; Kang, Ju-Yeon; Park, Hamin; Shin, Gwang-Hyuk; Hong, Woonggi; Im, Sung-Gap; Choi, Sung-Yool, RPGR 2019: Recent Progress in Graphene and Two-dimensional Materials Research Conference, Recent Progress in Graphene and Two-dimensional Materials Research, 2019-10-08 |
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