Negative Bias Illumination Stress(NBIS) Stability Analysis of MoS2 Thin-Film Transistor(TFT)

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Publisher
Recent Progress in Graphene and Two-dimensional Materials Research
Issue Date
2019-10-08
Language
English
Citation

RPGR 2019: Recent Progress in Graphene and Two-dimensional Materials Research Conference

URI
http://hdl.handle.net/10203/278760
Appears in Collection
EE-Conference Papers(학술회의논문)
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