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Characterization of the surface recombination velocity of HgCdTe using a gate-controlled diode Choi, JH; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.39, no.2B, pp.152 - 155, 2000-02 |
소수운반자 수명 측정을 이용한 HgCdTe 표면특성분석 = Surface property analysis of HgCdTe by lifetime meausrementlink 이민영; Lee, Min-Yung; et al, 한국과학기술원, 2002 |
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