소수운반자 수명 측정을 이용한 HgCdTe 표면특성분석Surface property analysis of HgCdTe by lifetime meausrement
- Advisors
- 이희철researcher; Lee, Hee-Chulresearcher
- Description
- 한국과학기술원 : 전기및전자공학전공,
- Publisher
- 한국과학기술원
- Issue Date
- 2002
- Identifier
- 174059/325007 / 020003370
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 전기및전자공학전공, 2002.2, [ ii, 62, [4] p. ]
- Keywords
표면재결합 속도; 누설전류; 광전도감쇠; 소수운반자 수명; 표면보호막; surface passivation layer; surface recombination velocity; leakage current; Photoconductive decay; minority carrier lifetime
- Appears in Collection
- EE-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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